SCIENCE

Bruker Corporation has announced the release of a new generation of Atomic Force Microscopy (AFM) modes and measurement modules that transform Bruker's AFM systems into turnkey solutions for nanoscale characterization in renewable energy research. The most significant of these new AFM accessories, the PeakForce TUNA module, enables very high resolution nanoelectrical characterization on fragile samples, including organic photovoltaics, lithium ion battery composites, and carbon nanotube--based device structures. Complementing this capability, Bruker's new offering for electrochemistry research provides wide solvent compatibility, ppm-level environmental control, and easy in-situ liquid scanning on an AFM.

"We are excited to offer ground-breaking new capabilities to scientists in growing areas of nanoelectrical characterization in materials research," said Dr. Mark R. Munch, President of the Bruker Nano Surfaces Business. "This new product release represents a significant advance in our continued drive to expand AFM technologies to energy markets by addressing customer needs for quantitative nanoscale characterization. We are gratified that these modules are among our first new product releases as part of Bruker. Building on our leadership position, they are a fitting continuation of the rapid stream of innovative new products that we have delivered over the past three years."

Mr. David Rossi, Vice President and General Manager of Bruker's AFM Unit, added: "Our new suite of nanoelectrical and electrochemical products are part of our development team's long heritage of AFM innovations in nanoscale research and they build on the foundation of PeakForce Tapping and ScanAsyst modes. We see unmet need for non-destructive and artifact-free nanoelectrical and electrochemical characterization in the growing arena of future energy generation and storage materials, and we are partnering with leading researchers and companies in those fields to deliver innovative products to enable their success."