TORONTO, CANADA -- Platform Computing Inc. and Silicon Metrics Corporation today announced the integration of Platform LSF with Silicon Metrics' SiliconSmart CR(TM) and SiliconSmart MR(TM), the de facto standard characterization and modeling solutions for standard cells and embedded memory. With these integrated solutions, library development and Systems-on-a-Chip (SoC) design teams can realize the full performance potential of their network environment through a distributed SiliconSmart(TM) characterization and modeling approach. The integration of Platform LSF with SiliconSmart CR and SiliconSmart MR creates an optimized integrated circuit (IC) design solution for the semiconductor market. The solution helps library development organizations shave days off the characterization and modeling process by increasing CPU utilization, maximizing SiliconSmart CR and SiliconSmart MR licenses, and streamlining the process of creating complex libraries. Running in a distributed environment, SiliconSmart CR and SiliconSmart MR offer their users the best operating environment for high throughput and the shortest path to high-quality, production-ready standard cell and embedded memory models. "The integration of Platform LSF with Silicon Metrics' characterization and modeling tools is the ideal solution for the rapid generation of production-ready model libraries," said Chris Collins, Engineering CAD Manager at Dallas Semiconductor. "This solution gives us rapid access to the highest quality, most accurate libraries possible to meet the demand of smaller feature sizes and accelerating development schedules." "Our customers consistently report significant performance increases in their library development processes since we've integrated SiliconSmart CR and SiliconSmart MR with Platform LSF," said Dennis George, Director of Product Marketing for Silicon Metrics Corporation. "By leveraging the compute-intensive power of Platform LSF with our optimized approach to characterization and modeling, we can provide an almost linear improvement in throughput with each additional CPU." "The seamless integration of these two leading solutions enables library developers and chip designers to fully optimize their hardware resources and to accelerate the characterization and modeling process, without sacrificing accuracy," said Michael Sharma, Vice President, Business Development, Platform. "With this integrated solution designed for a compute-intensive process, Silicon Metrics' customers can leverage the power of enterprise computing resources to improve product quality and quicken time to market." Platform LSF optimizes the use of enterprise-wide resources by providing transparent access to valuable computing resources, as and when required. By harnessing all available computing resources - servers, desktops, supercomputers and clusters - organizations can process tasks efficiently, complete workloads faster and increase user productivity. For more information visit www.platform.com